1Tb HDD 외부 USB 3.0 드라이브에 몇 가지 문제가 있습니다. 잘못된 방식으로 포맷했습니다. /dev/sdb1 대신 /dev/sdb를 썼는데 이제 드라이브를 사용할 수 없습니다.
fdisk /dev/sdb
fdisk: unable to read /dev/sdb: Input/output error
지난 토요일에 dd 명령을 사용하여 0으로 sdb 장치에 기록했습니다. 오늘 프로세스가 완료되었습니다(내 두 번째 컴퓨터에서 이 명령을 일주일 동안 실행했습니다). 그런데 dd에 관해 흥미로운 점을 발견했습니다. count = 1로 설정하면 다음이 표시됩니다.
bs=512 - Input/Output error
bs=1024 - Input/Output error
bs=4096 - Okay!
하지만 내가 한 일은 아무 것도 효과가 없었습니다. sfdisk는 또한 IO 오류가 있다고 말했습니다.
HDD는 SATA에 연결되며 USB 어댑터가 필요하지 않습니다.
내가 뭘 한거지...
- gparted를 사용하여 모든 파티션을 삭제했습니다.
- 새 파티션 테이블을 생성했지만 gparted가 충돌했습니다.
- fdisk를 사용하여 파티션을 다시 만들었습니다.
- 내 머릿속에 무슨 일이 일어났고 dd를 사용하여 장치를 0으로 채우기로 결정했습니다.
- dd를 시작하고 프로세스를 완료하는 데 며칠이 걸릴지 계산할 때 Ctrl+C를 누르고... fdisk에서 블록 0을 읽거나 쓸 수 없다고 말합니다.
dd가 모든 디스크와 다른 많은 디스크를 채울 때까지 기다리면서 sfdisk를 사용해 보았습니다.
dmesg가 말했습니다:
[573000.557900] Buffer I/O error on device sdb, logical block 244187588
[573000.558550] lost page write due to I/O error on sdb
smartctl -a /dev/sdb:
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-95-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Seagate Momentus SpinPoint M8 (AF)
Device Model: ST1000LM024 HN-M101MBB
Serial Number: S318J9DG719286
LU WWN Device Id: 5 0004cf 21029e6dc
Firmware Version: 2BA30001
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sat Sep 10 13:39:04 2016 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 23) The self-test routine was aborted by
the host.
Total time to complete Offline
data collection: (12480) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 208) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 0
2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0
3 Spin_Up_Time 0x0023 090 089 025 Pre-fail Always - 3246
4 Start_Stop_Count 0x0032 089 089 000 Old_age Always - 11227
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 4289
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 19
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 247
191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 80
192 Power-Off_Retract_Count 0x0022 100 100 000 Old_age Always - 48
194 Temperature_Celsius 0x0002 064 054 000 Old_age Always - 26 (Min/Max 16/46)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 1241
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 19
225 Load_Cycle_Count 0x0032 079 079 000 Old_age Always - 221164
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Aborted by host 70% 427 -
# 2 Short offline Completed without error 00% 330 -
# 3 Short offline Completed without error 00% 162 -
# 4 Short offline Completed without error 00% 52 -
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Aborted_by_host [70% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
답변1
4k 섹터에 쓸 수 있고 HDD가 제대로 작동한다면 이는 아마도 이것이 기본 4k HDD(때때로고급 형식), 512바이트 섹터를 시뮬레이션할 수 없습니다. 이런 드라이브는 본 적이 없습니다. 제가 사용한 모든 드라이브는 512개 섹터를 에뮬레이트할 수 있지만 정렬되지 않은 액세스로 인해 약간 느립니다.
dd if=/dev/sdb of=/dev/null bs=1m
HDD가 읽기를 시작하고 즉시 중지되지 않는지 확인해야 합니다 ( 1m
4k의 배수). 명령이 제대로 실행 되면 dd
4k 드라이브인 것 같습니다. 이러한 HDD에 액세스하려면 4K 섹터 액세스를 조정할 수 있는 도구가 필요합니다.
답변2
겉으로 보기에는 디스크가 죽은 것 같습니다(또는 처음부터 결함이 있을 수도 있음). 파티션을 나누는 대신 장치를 포맷하면 이 작업을 수행할 수 없습니다. 장치에 손상을 주지 않고 몇 번이나 이런 일이 발생했습니다(데이터와 달리... :)
비슷한 디스크인 2TB 외부 USB3 Seagate가 있는데 비교를 위해 smartctl 출력을 게시하겠습니다. 지금은 확장된 자체 테스트를 실행해 보겠습니다(gui GSmartControl 또는 smartctl을 사용합니다. 시간이 걸립니다. 저는 운전에 약 6시간이 걸렸고 여러분은 그 시간의 절반 정도였습니다.)
root@fubuntu:~# smartctl -a /dev/sdc |tee sdc-smartctl-`ds`.log
smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-36-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Seagate Samsung SpinPoint M9T
Device Model: ST2000LM003 HN-M201RAD
Serial Number: S34RJ9FG538619
LU WWN Device Id: 5 0004cf 20fceabd1
Firmware Version: 2BC10008
User Capacity: 2 000 398 934 016 bytes [2,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sat Sep 10 15:17:41 2016 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (24480) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 408) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 0
2 Throughput_Performance 0x0026 056 056 000 Old_age Always - 22251(vs.0)
3 Spin_Up_Time 0x0023 088 087 025 Pre-fail Always - 3875
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 326(vs 11227!)
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 414
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 87
191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 31
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 (aka unclean shutdown, yours 48 for just 247 total power cycles.
194 Temperature_Celsius 0x0002 064 049 000 Old_age Always - 23 (Min/Max 15/51)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 6 (vs 1241)
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 2 (vs 19)
225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 3879 (vs 221164!)
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 398 - Do the extended offline test.
# 2 Short offline Completed without error 00% 383 -
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
IMHO 이것은 하드웨어 오류입니다. 디스크가 이미 완료되었지만 어쨌든 확장된 오프라인 자체 테스트를 수행하겠습니다. 아직 보증 기간이 남아 있나요?