WD Elements 2TB가 있습니다. 삭제하거나 포맷을 시도했지만 성공하지 못했습니다. 3일 넘게 오랜 시간이 걸렸지만 아무 일도 일어나지 않았습니다. 진행률이 1%에 멈춰있습니다.
또한 불량 섹터 확인 시도가 30분 후에도 계속되지 않습니다.
:~$ sudo badblocks -svw -o badblocks.log /dev/sdc
Checking for bad blocks in read-write mode
From block 0 to 1953481727
Testing with pattern 0xaa: 0.01% done, 31:34 elapsed. (0/0/0 errors)
이것은 (smartctl --all)의 출력입니다.
~$ sudo smartctl --all /dev/sdd
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.0-52-generic] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Elements / My Passport (USB, AF)
Device Model: WDC WD20NMVW-11AV3S2
Serial Number: WD-WX21E949F5A4
LU WWN Device Id: 5 0014ee 20b794cca
Firmware Version: 01.01A01
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5200 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Thu Nov 3 23:08:31 2022 +03
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
Warning: This result is based on an Attribute check.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (37620) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 415) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x7035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 49
3 Spin_Up_Time 0x0027 216 193 021 Pre-fail Always - 4166
4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 1535
5 Reallocated_Sector_Ct 0x0033 133 133 140 Pre-fail Always FAILING_NOW 2805
7 Seek_Error_Rate 0x002e 001 001 000 Old_age Always - 40614
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 2221
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1407
192 Power-Off_Retract_Count 0x0032 199 199 000 Old_age Always - 1370
193 Load_Cycle_Count 0x0032 187 187 000 Old_age Always - 40166
194 Temperature_Celsius 0x0022 107 101 000 Old_age Always - 45
196 Reallocated_Event_Count 0x0032 002 001 000 Old_age Always - 198
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 7 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 7 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 02 00 00 00 00 00 00 00:01:23.524 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:23.524 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
Error 6 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 06 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 90 06 00 00 00 00 00 00:01:23.524 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
Error 5 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 02 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
Error 4 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 0f 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:22.578 IDENTIFY DEVICE
Error 3 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:22.578 IDENTIFY DEVICE
b0 d0 00 00 4f c2 00 00 00:00:17.757 SMART READ DATA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
죽었나요 아니면 고칠 수 있나요?
PS: 저는 Ubuntu 22.04를 사용하고 있습니다.
답변1
그 디스크가 죽어가고 있습니다.
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
SMART 속성을 살펴보겠습니다.
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
...
5 Reallocated_Sector_Ct 0x0033 133 133 140 Pre-fail Always FAILING_NOW 2805
7 Seek_Error_Rate 0x002e 001 001 000 Old_age Always - 40614
...
196 Reallocated_Event_Count 0x0032 002 001 000 Old_age Always - 198
내부적으로 재할당된 섹터 수가 한계에 도달하면 오류 메시지가 발생합니다. 디스크의 최소 2805개 블록을 더 이상 읽을 수 없으며 디스크 자체에 의해 내부적으로 예비 블록으로 리디렉션되었습니다.
재할당 이벤트 수(원시 값)는 198입니다. 이는 평균적으로 한 번에 10개 이상의 실패한 블록이 있는 지역에서 이러한 2805개의 블록이 감지되었음을 나타냅니다. 이는 디스크 표면에 심각한 물리적 손상이 있는 영역이 있을 수 있음을 나타냅니다. 어떤 소프트웨어 명령도 이 문제를 해결할 수 없습니다.
(예를 들어, 전원이 켜져 있는 동안 디스크가 부딪히면 읽기/쓰기 헤드가 실제로 디스크 표면에 닿아 실제 자성 물질이 해당 영역에서 격렬하게 벗겨질 수 있습니다. 그 결과로 발생하는 자성 먼지로 인해 읽기/쓰기 헤드가 막힐 수 있습니다. , 성능이 저하되거나 다른 문제가 발생하는 다른 위치에 착륙합니다.
그리고 탐색 오류율(확장된 값)은 실패 임계값(임계값은 "0"임에도 불구하고)에서 단지 한 단계 떨어진 것처럼 보입니다. 이 표시가 정확하면 디스크의 부팅 자체 테스트가 실패하고 언제든지 완전히 액세스할 수 없게 될 수 있습니다.
기본적으로 디스크가 여전히 작동하는 유일한 이유는 여전히 읽을 수 있는 중요한 데이터를 백업할 수 있는 마지막 기회를 제공하기 위해 최선을 다하고 있기 때문입니다.
이제 디스크를 폐기하고 새 디스크를 구입할 때입니다. 그 안의 모든 데이터를 복구할 수 없는지 확인해야 하는 경우 디스크 케이스를 열고 디스크 플래터를 제거한 후 플라스틱 가방에 넣고(파편이 있을 수 있으므로) 가장 큰 망치로 조각으로 부수십시오. 이러한 목적으로 개체를 쉽게 사용할 수 있습니다.
어떤 사람은 다음과 같이 말했습니다(다른 표현으로): "모든 하드 드라이브는 궁극적으로 낡아빠지는 기계일 뿐입니다. 데이터 저장은 일시적인 부작용일 뿐입니다."