내 SSD는 다음을 제공합니다.
$ smartctl -a /dev/sdg
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.0-67-generic] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Crucial/Micron BX/MX1/2/3/500, M5/600, 1100 SSDs
Device Model: Crucial_CT525MX300SSD1
Serial Number: 1711164B7A3E
LU WWN Device Id: 5 00a075 1164b7a3e
Firmware Version: M0CR040
User Capacity: 525,112,713,216 bytes [525 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Apr 14 22:11:44 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x04) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1114) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 8) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 000 Pre-fail Always - 458
5 Reallocate_NAND_Blk_Cnt 0x0032 090 090 010 Old_age Always - 168
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 9593
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 730
171 Program_Fail_Count 0x0032 100 100 000 Old_age Always - 61
172 Erase_Fail_Count 0x0032 100 100 000 Old_age Always - 0
173 Ave_Block-Erase_Count 0x0032 088 088 000 Old_age Always - 183
174 Unexpect_Power_Loss_Ct 0x0032 100 100 000 Old_age Always - 241
183 SATA_Interfac_Downshift 0x0032 100 100 000 Old_age Always - 2
184 Error_Correction_Count 0x0032 100 100 000 Old_age Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 4195967
194 Temperature_Celsius 0x0022 066 049 000 Old_age Always - 34 (Min/Max 17/51)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 168
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 6
199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 0
202 Percent_Lifetime_Remain 0x0030 088 088 001 Old_age Offline - 12
206 Write_Error_Rate 0x000e 100 100 000 Old_age Always - 61
246 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 48747389732
247 Host_Program_Page_Count 0x0032 100 100 000 Old_age Always - 1523636483
248 FTL_Program_Page_Count 0x0032 100 100 000 Old_age Always - 4535443961
180 Unused_Reserve_NAND_Blk 0x0033 000 000 000 Pre-fail Always - 1781
210 Success_RAIN_Recov_Cnt 0x0032 100 100 000 Old_age Always - 1488
SMART Error Log Version: 1
Warning: ATA error count 1663 inconsistent with error log pointer 2
ATA Error Count: 1663 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1663 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 a0 52 5e 40 Error: UNC at LBA = 0x005e52a0 = 6181536
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 a0 52 5e 40 08 44d+02:41:25.408 READ FPDMA QUEUED
60 00 08 00 40 61 40 08 44d+02:41:25.408 READ FPDMA QUEUED
60 00 08 00 b0 d8 40 08 44d+02:41:25.408 READ FPDMA QUEUED
60 00 68 88 af 78 40 08 44d+02:41:25.408 READ FPDMA QUEUED
60 00 80 00 af 78 40 08 44d+02:41:25.408 READ FPDMA QUEUED
Error 1662 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 d8 52 5e 40 Error: UNC at LBA = 0x005e52d8 = 6181592
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 d8 52 5e 40 08 44d+02:40:25.408 READ FPDMA QUEUED
47 00 01 30 06 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 30 00 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 00 00 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 30 08 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
Error 1661 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 d8 52 5e 40 Error: UNC at LBA = 0x005e52d8 = 6181592
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 d8 52 5e 40 08 44d+02:40:25.408 READ FPDMA QUEUED
47 00 01 30 06 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 30 00 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 00 00 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 30 08 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
Error 1660 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 d8 52 5e 40 Error: UNC at LBA = 0x005e52d8 = 6181592
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 d8 52 5e 40 08 44d+02:40:25.408 READ FPDMA QUEUED
47 00 01 30 06 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 30 00 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 00 00 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 30 08 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
Error 1659 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 d8 52 5e 40 Error: UNC at LBA = 0x005e52d8 = 6181592
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 08 d8 52 5e 40 08 44d+02:40:25.408 READ FPDMA QUEUED
47 00 01 30 06 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 30 00 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 00 00 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
47 00 01 30 08 00 e0 08 44d+02:40:25.408 READ LOG DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xff) Completed without error 00% 9591 -
# 2 Offline Completed without error 00% 9573 -
# 3 Vendor (0xff) Completed without error 00% 9571 -
# 4 Extended offline Completed without error 00% 9505 -
# 5 Extended offline Completed without error 00% 9337 -
# 6 Extended offline Completed without error 00% 9169 -
# 7 Extended offline Completed without error 00% 9002 -
# 8 Extended offline Completed without error 00% 8834 -
# 9 Vendor (0xff) Completed without error 00% 8834 -
#10 Extended offline Completed without error 00% 8666 -
#11 Vendor (0xff) Completed without error 00% 8666 -
#12 Extended offline Completed without error 00% 8498 -
#13 Extended offline Completed without error 00% 8330 -
#14 Vendor (0xff) Completed without error 00% 8330 -
#15 Extended offline Completed without error 00% 8162 -
#16 Vendor (0xff) Completed without error 00% 8162 -
#17 Extended offline Completed without error 00% 7994 -
#18 Extended offline Completed without error 00% 7826 -
#19 Extended offline Completed without error 00% 7658 -
#20 Extended offline Completed without error 00% 7490 -
#21 Vendor (0xff) Completed without error 00% 7405 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
하지만 pv오류 없이 작동합니다.
pv /dev/sdg >/dev/null
읽기 오류가 수정된 것 같습니다. 아마도 블록을 덮어쓰는 것 같습니다.
그렇다면 불평하지 않도록 오류를 어떻게 지울 수 있습니까 smartd?